Chapter 16. Near-Field Optics

  1. Prof. Dror Sarid

Published Online: 16 FEB 2007

DOI: 10.1002/9783527610068.ch16

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

How to Cite

Sarid, D. (2006) Near-Field Optics, in Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527610068.ch16

Author Information

  1. College of Optical Science, University of Arizona, Tucson, Arizona 85721, USA

Publication History

  1. Published Online: 16 FEB 2007
  2. Published Print: 15 DEC 2006

ISBN Information

Print ISBN: 9783527406173

Online ISBN: 9783527610068

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Keywords:

  • scanning probe microscopy;
  • MATHEMATICA;
  • near-field optics;
  • far-field solution;
  • near-field solution;
  • discussion of models;
  • scattered electric fields;
  • patterned apertures

Summary

This chapter contains sections titled:

  • Introduction

  • Far-Field Solution

    • Vector Potential

    • Electric Field

    • Electric Vector Field in the ◯–ẑ Plane

    • Electric Vector Field in the ◯–ŷ Plane

    • Magnetic Field

    • Poynting Vector and Intensity

    • Intensity in the ◯–ẑ Plane

    • Intensity in the ◯–ŷ Plane

  • Near-Field Solution

    • Transformation

    • Electric Field

    • Electric Field in the ◯–ŷ Plane

    • Magnetic Field

    • Poynting Vector and Intensity

  • Discussion of the Models

    • Electric Field

    • Intensity

  • Scattered Electric Fields Around Patterned Apertures

  • Exercises for Chapter 16

  • References