Chapter 18. Scanning Thermal Conductivity Microscopy
Published Online: 16 FEB 2007
DOI: 10.1002/9783527610068.ch18
Copyright © 2007 Wiley-VCH Verlag GmbH & Co. KGaA
Book Title
Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition
Additional Information
How to Cite
Sarid, D. (2007) Scanning Thermal Conductivity Microscopy, in Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527610068.ch18
Publication History
- Published Online: 16 FEB 2007
- Published Print: 15 DEC 2006
ISBN Information
Print ISBN: 9783527406173
Online ISBN: 9783527610068
- Summary
- Chapter
Keywords:
- scanning probe microscopy;
- MATHEMATICA;
- scanning thermal conductivity microscopy;
- thermal response;
- thermal cantilever bending;
- mechanical cantilever bending
Summary
This chapter contains sections titled:
Introduction
Theory of Thermal Response
Electrical and Thermal Circuits
Cantilever Thermal Resistance and Temperature
Tip–Sample Thermal Resistance
Tip Thermal Resistance and Temperature
Thermal and Mechanical Cantilever Bending
Mechanical Bending
Thermal Bending
Combined Solution
Results
Tip-Side Coating, Upward Thermal Bending: Si and SiO2
Top-Side Coating, Downward Thermal Bending: Si and SiO2
Tip- and Top-Side Coating η-Dependent Apparent Height
Tip- and Top-Side Coating κ-Dependent Apparent Height
Exercises for Chapter 18
References