Chapter 18. Scanning Thermal Conductivity Microscopy

  1. Prof. Dror Sarid

Published Online: 16 FEB 2007

DOI: 10.1002/9783527610068.ch18

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

How to Cite

Sarid, D. (2006) Scanning Thermal Conductivity Microscopy, in Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527610068.ch18

Author Information

  1. College of Optical Science, University of Arizona, Tucson, Arizona 85721, USA

Publication History

  1. Published Online: 16 FEB 2007
  2. Published Print: 15 DEC 2006

ISBN Information

Print ISBN: 9783527406173

Online ISBN: 9783527610068

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Keywords:

  • scanning probe microscopy;
  • MATHEMATICA;
  • scanning thermal conductivity microscopy;
  • thermal response;
  • thermal cantilever bending;
  • mechanical cantilever bending

Summary

This chapter contains sections titled:

  • Introduction

  • Theory of Thermal Response

    • Electrical and Thermal Circuits

    • Cantilever Thermal Resistance and Temperature

    • Tip–Sample Thermal Resistance

    • Tip Thermal Resistance and Temperature

  • Thermal and Mechanical Cantilever Bending

    • Mechanical Bending

    • Thermal Bending

    • Combined Solution

  • Results

    • Tip-Side Coating, Upward Thermal Bending: Si and SiO2

    • Top-Side Coating, Downward Thermal Bending: Si and SiO2

    • Tip- and Top-Side Coating η-Dependent Apparent Height

    • Tip- and Top-Side Coating κ-Dependent Apparent Height

  • Exercises for Chapter 18

  • References