Chapter 19. Kelvin Probe Force Microscopy

  1. Prof. Dror Sarid

Published Online: 16 FEB 2007

DOI: 10.1002/9783527610068.ch19

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition

How to Cite

Sarid, D. (2006) Kelvin Probe Force Microscopy, in Exploring Scanning Probe Microscopy with MATHEMATICA, Second Edition, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527610068.ch19

Author Information

  1. College of Optical Science, University of Arizona, Tucson, Arizona 85721, USA

Publication History

  1. Published Online: 16 FEB 2007
  2. Published Print: 15 DEC 2006

ISBN Information

Print ISBN: 9783527406173

Online ISBN: 9783527610068

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Keywords:

  • scanning probe microscopy;
  • MATHEMATICA;
  • Kelvin Probe Force Microscopy;
  • capacitance derivatives;
  • contact potential difference

Summary

This chapter contains sections titled:

  • Introduction

  • Capacitance Derivatives

    • Tip–Sample Capacitance Derivative

    • Cantilever–Sample Capacitance Derivative

  • Measurement of Contact Potential Difference

    • Tip–Sample and Cantilever–Sample Electrostatic Forces

    • Harmonic Expansion of Tip–Sample Force

    • Thermal Noise Limitations

  • Exercises for Chapter 19

  • References