Chapter 2. Application of Synchrotron X-Radiation to Problems in Materials Science

  1. Dr. Eric Lifshin
  1. Andrea R. Gerson2,
  2. Peter J. Halfpenny1,
  3. Stefania Pizzini3,
  4. Radoljub Ristíc1,
  5. Kevin J. Roberts4,
  6. David B. Sheen5 and
  7. John N. Sherwood1

Published Online: 24 DEC 2007

DOI: 10.1002/9783527613748.ch2

X-ray Characterization of Materials

X-ray Characterization of Materials

How to Cite

Gerson, A. R., Halfpenny, P. J., Pizzini, S., Ristíc, R., Roberts, K. J., Sheen, D. B. and Sherwood, J. N. (1999) Application of Synchrotron X-Radiation to Problems in Materials Science, in X-ray Characterization of Materials (ed E. Lifshin), Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527613748.ch2

Editor Information

  1. Characterization and Environmental, Technology Laboratory, GE Corporate Research and Technology, 1 Research Circle, Niskayuna, NY 12309, USA

Author Information

  1. 1

    Department of Pure and Applied Chemistry, University of Strathclyde, Glasgow, U. K.

  2. 2

    Department of Chemistry, King's College, University of London, U. K.

  3. 3

    LURE, Bâtiment 205D, Centre Universitaire Paris-Sud, Orsay-Cedex, France

  4. 4

    SERC Daresbury Laboratory, Warrington, U. K.

  5. 5

    Characterization and Environmental, Technology Laboratory, GE Corporate Research and Technology, 1 Research Circle, Niskayuna, NY 12309, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 24 JUN 1999

ISBN Information

Print ISBN: 9783527296576

Online ISBN: 9783527613748

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Keywords:

  • x-Ray absorption spectroscopy;
  • x-Ray diffraction;
  • scattering;
  • x-Ray standing wave spectroscopy;
  • lattice defects

Summary

This chapter contains sections titled:

  • Introduction

  • X-Ray Absorption Spectroscopy

  • Structural Studies Using X-Ray Diffraction

  • Diffraction and Scattering from Real Surfaces and Interfaces

  • X-Ray Standing Wave Spectroscopy

  • Characterisation of Lattice Defects Using X-Ray Topography

  • Conclusions and Future Perspective

  • Acknowledgements

  • References