Chapter 3. X-Ray Fluorescence Analysis

  1. Dr. Eric Lifshin
  1. Ron Jenkins

Published Online: 24 DEC 2007

DOI: 10.1002/9783527613748.ch3

X-ray Characterization of Materials

X-ray Characterization of Materials

How to Cite

Jenkins, R. (1999) X-Ray Fluorescence Analysis, in X-ray Characterization of Materials (ed E. Lifshin), Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527613748.ch3

Editor Information

  1. Characterization and Environmental, Technology Laboratory, GE Corporate Research and Technology, 1 Research Circle, Niskayuna, NY 12309, USA

Author Information

  1. International Centre for Diffraction Data, Newtown Square, PA, U.S.A.

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 24 JUN 1999

ISBN Information

Print ISBN: 9783527296576

Online ISBN: 9783527613748



  • x-ray wavelengths;
  • properties of X-radiation;
  • x-ray fluorescence;
  • x-ray spectrometer;
  • quantitative analysis


This chapter contains sections titled:

  • Introduction

  • Historical Development of X-ray Spectrometry

  • X-ray Wavelengths

  • Properties of X-radiation

  • Instrumentation for X-ray Fluorescence

  • Qualitative Analysis with the X-ray Spectrometer

  • Accuracy of X-ray Fluorescence

  • Quantitative Analysis

  • Trace Analysis

  • References