Chapter 2. Physical Phenomena Relevant to STM and AFM

  1. Dr. Sergei N. Magonov1 and
  2. Dr. Myung-Hwan Whangbo2

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615117.ch2

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

How to Cite

Magonov, S. N. and Whangbo, M.-H. (1995) Physical Phenomena Relevant to STM and AFM, in Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615117.ch2

Author Information

  1. 1

    Digital Instruments, 520 E. Montecito St., Santa Barbara, CA 93103, USA

  2. 2

    Department of Chemistry, North Carolina State Univ., Raleigh, NC 27695-8204, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 14 DEC 1995

ISBN Information

Print ISBN: 9783527293131

Online ISBN: 9783527615117

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Keywords:

  • scanning probe microscopy;
  • electron transport processes;
  • conventional electron tunneling regime;
  • force interaction;
  • adhesion

Summary

This chapter contains sections titled:

  • Electron Transport Processes

  • Survey of Force Interactions