Chapter 4. Practical Aspects of STM and AFM Measurements

  1. Dr. Sergei N. Magonov1 and
  2. Dr. Myung-Hwan Whangbo2

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615117.ch4

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

How to Cite

Magonov, S. N. and Whangbo, M.-H. (1995) Practical Aspects of STM and AFM Measurements, in Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615117.ch4

Author Information

  1. 1

    Digital Instruments, 520 E. Montecito St., Santa Barbara, CA 93103, USA

  2. 2

    Department of Chemistry, North Carolina State Univ., Raleigh, NC 27695-8204, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 14 DEC 1995

ISBN Information

Print ISBN: 9783527293131

Online ISBN: 9783527615117

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Keywords:

  • scanning tunneling microscope;
  • optimization of scanning probe microscopy;
  • large-scale imaging;
  • atomic-scale imaging;
  • image artifacts

Summary

This chapter contains sections titled:

  • Samples

  • Optimization of Experiments

  • STM and AFM Measurements