Chapter 7. STM Images Associated with Point Defects of Layered Inorganic Compounds

  1. Dr. Sergei N. Magonov1 and
  2. Dr. Myung-Hwan Whangbo2

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615117.ch7

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

How to Cite

Magonov, S. N. and Whangbo, M.-H. (1995) STM Images Associated with Point Defects of Layered Inorganic Compounds, in Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615117.ch7

Author Information

  1. 1

    Digital Instruments, 520 E. Montecito St., Santa Barbara, CA 93103, USA

  2. 2

    Department of Chemistry, North Carolina State Univ., Raleigh, NC 27695-8204, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 14 DEC 1995

ISBN Information

Print ISBN: 9783527293131

Online ISBN: 9783527615117

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Keywords:

  • scanning tunneling microscope;
  • layered Inorganic Compounds;
  • donor substitution;
  • atomic-scale Images;
  • electronic band structure calculations

Summary

This chapter contains sections titled:

  • Imperfections in Compounds with Metal Clusters

  • Point Defects in Semiconductor 2H-MoS2

  • Cases lhctable by Electronic Band Structure Calculations

  • Cases Intractable by Electronic Band Structure Calculations

  • Survey of Image Imperfections Observed for d2 2H-MX2 Systems

  • Concluding Remarks