Chapter 9. Surface Relaxation in STM and AFM Images

  1. Dr. Sergei N. Magonov1 and
  2. Dr. Myung-Hwan Whangbo2

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615117.ch9

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis

How to Cite

Magonov, S. N. and Whangbo, M.-H. (1995) Surface Relaxation in STM and AFM Images, in Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615117.ch9

Author Information

  1. 1

    Digital Instruments, 520 E. Montecito St., Santa Barbara, CA 93103, USA

  2. 2

    Department of Chemistry, North Carolina State Univ., Raleigh, NC 27695-8204, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 14 DEC 1995

ISBN Information

Print ISBN: 9783527293131

Online ISBN: 9783527615117

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Keywords:

  • scanning tunneling microscope;
  • surface relaxation;
  • atomic force microscopy;
  • layered transition-metal tellurides;
  • atomic-scale deformation

Summary

This chapter contains sections titled:

  • Tip Force Induced Deformation in HOPG

  • Wagon-Wheel Patterns of MoSe2 Epilayers on MoS2

  • STM and AFM Images of α-RuC13 and α-MoC13

  • Layered lhnsition-Metal Tellurides MAxTe2

  • Tip Force Induced Changes in AFM Images of NbTe2

  • Nanoscale Ring Structures of MoS2 and WSe2

  • Concluding Remarks