Chapter 2. Scanning Tunneling Microscopy (STM)

  1. N. John DiNardo

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615957.ch2

Nanoscale Characterization of Surfaces and Interfaces

Nanoscale Characterization of Surfaces and Interfaces

How to Cite

DiNardo, N. J. (1994) Scanning Tunneling Microscopy (STM), in Nanoscale Characterization of Surfaces and Interfaces, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615957.ch2

Author Information

  1. Department of Physics and Atmospheric Science, Drexel University, Philadelphia, PA 19104, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 26 MAY 1994

ISBN Information

Print ISBN: 9783527292479

Online ISBN: 9783527615957

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Keywords:

  • scanning tunneling microscopy;
  • electron tunneling;
  • inelastic tunneling spectroscopy;
  • microscope design;
  • shock isolation

Summary

This chapter contains sections titled:

  • Historical Perspective

  • Theory

  • Instrumentation

  • Semiconductor Surfaces

  • Metal-Semiconductor Interfaces

  • Metal Surfaces

  • Insulators

  • Layered Compounds

  • Charge Density Wave Systems

  • Superconductors

  • Molecular Films, Adsorbates, and Surface Chemistry

  • Electrochemistry at Liquid-Solid Interfaces

  • Biological Systems

  • Metrological Applications