Chapter 5. Spin-offs of STM — Non-Contact Nanoscale Probes

  1. N. John DiNardo

Published Online: 24 DEC 2007

DOI: 10.1002/9783527615957.ch5

Nanoscale Characterization of Surfaces and Interfaces

Nanoscale Characterization of Surfaces and Interfaces

How to Cite

DiNardo, N. J. (1994) Spin-offs of STM — Non-Contact Nanoscale Probes, in Nanoscale Characterization of Surfaces and Interfaces, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527615957.ch5

Author Information

  1. Department of Physics and Atmospheric Science, Drexel University, Philadelphia, PA 19104, USA

Publication History

  1. Published Online: 24 DEC 2007
  2. Published Print: 26 MAY 1994

ISBN Information

Print ISBN: 9783527292479

Online ISBN: 9783527615957

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Keywords:

  • scanning Near-Field Optical Microscope;
  • photon Scanning Tunneling Microscope;
  • scanning Thermal Profiler;
  • scanning Chemical Potential Microscope;
  • optical Absorption Microscope

Summary

This chapter contains sections titled:

  • Scanning Near-Field Optical Microscope (SNOM)

  • Photon Scanning Thnneling Microscope (PSTM)

  • Scanning Thermal Profiler (STP)

  • Scanning Chemical Potential Microscope (SCPM)

  • Optical Absorption Microscope (OAW

  • Scanning Ion Conductance Microscope (SICM)