Chapter 2. Material Characterization
- Prof. Dr. O. Brand2 and
- Dr. G. K. Fedder3
Published Online: 29 FEB 2008
Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA
CMOS - MEMS
How to Cite
Paul, O. and Ruther, P. (2005) Material Characterization, in CMOS - MEMS (eds O. Brand and G. K. Fedder), Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527616718.ch2
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0250, USA
ECE Department & The Robotics Institute, Carnegie Mellon, University, Pittsburgh, PA 15213-3890, USA
- Published Online: 29 FEB 2008
- Published Print: 26 JAN 2005
Print ISBN: 9783527310807
Online ISBN: 9783527616718
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