Chapter 6. IR Spectroscopy of the Semiconductor/Solution Interface

  1. Prof. Richard C. Alkire1,
  2. Prof. Dieter M. Kolb2,
  3. Prof. Jacek Lipkowski3 and
  4. Prof. Philip N. Ross4
  1. Jean-Noël Chazalviel and
  2. François Ozanam

Published Online: 4 MAR 2008

DOI: 10.1002/9783527616817.ch6

Advances in Electrochemical Science and Engineering: Diffraction and Spectroscopic Methods in Electrochemistry, Volume 9

Advances in Electrochemical Science and Engineering: Diffraction and Spectroscopic Methods in Electrochemistry, Volume 9

How to Cite

Chazalviel, J.-N. and Ozanam, F. (2006) IR Spectroscopy of the Semiconductor/Solution Interface, in Advances in Electrochemical Science and Engineering: Diffraction and Spectroscopic Methods in Electrochemistry, Volume 9 (eds R. C. Alkire, D. M. Kolb, J. Lipkowski and P. N. Ross), Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527616817.ch6

Editor Information

  1. 1

    University of Illinois, 600 South Mathews Avenue, Urbana, IL 61801, USA

  2. 2

    University of Ulm, Department of Electrochemistry, Albert-Einstein-Allee 47, 89081 Ulm, Germany

  3. 3

    University of Guelph, Department of Chemistry, N1G 2W1 Guelph, Ontario, Canada

  4. 4

    Lawrence Berkeley National Laboratory, Materials Science Department, 1 Cyclotron Road MS 2–100, Berkeley, CA 94720-0001, USA

Publication History

  1. Published Online: 4 MAR 2008
  2. Published Print: 20 JUL 2006

ISBN Information

Print ISBN: 9783527313174

Online ISBN: 9783527616817

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Keywords:

  • in-situ;
  • propagating;
  • perpendicular;
  • semiconductors;
  • thin-electrolyte

Summary

This chapter contains sections titled:

  • Introduction

  • IR Spectroscopy at an Interface

  • Practical Aspects at an Electrochemical Interface

  • What can be Learnt from IR Spectroscopy at the Interface

  • Effect of Light Polarization in ATR Geometry

  • Dynamic Information from a Modulation Technique

  • Case of Rough or Complex Interfaces

  • Conclusion