Chapter 2. Field Emission and Field Ion Microscopy (Including Atom Probe FIM)

  1. S. Amelinckx,
  2. D. van Dyck,
  3. J. van Landuyt and
  4. G. van Tendeloo

Published Online: 2 JUN 2008

DOI: 10.1002/9783527620524.ch11

Handbook of Microscopy: Methods II: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 2

Handbook of Microscopy: Methods II: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 2

How to Cite

Amelinckx, S., van Dyck, D., van Landuyt, J. and van Tendeloo, G. (eds) (1996) Field Emission and Field Ion Microscopy (Including Atom Probe FIM), in Handbook of Microscopy: Methods II: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 2, Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527620524.ch11

Editor Information

  1. Electron Microscopy for Materials Science (EMAT), Universitty of Antwerp - RUCA, Groenenborgerlaan 171, 2020 Antwerp, Belgium

Publication History

  1. Published Online: 2 JUN 2008
  2. Published Print: 27 DEC 1996

ISBN Information

Print ISBN: 9783527294732

Online ISBN: 9783527620524

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Keywords:

  • scanning electron;
  • electron sources;
  • field emission microscope;
  • transmission electron;
  • field ion microscope

Summary

The prelims comprise:

  • Field Emission Microscopy

  • Field Ion Microscopy

  • Atom Probe Microanalysis

  • Three-Dimensional Atom Probes

  • Survey of Commercia]]y Available Instrumentation

  • References