Chapter 5. Point Defects, Diffusion, and Precipitation

  1. Prof. Kenneth A. Jackson3 and
  2. Prof. Dr. Wolfgang Schröter4
  1. T. Y. Tan1 and
  2. U. Gösele2

Published Online: 28 MAY 2008

DOI: 10.1002/9783527621842.ch5

Handbook of Semiconductor Technology: Electronic Structure and Properties of Semiconductors, Volume 1

Handbook of Semiconductor Technology: Electronic Structure and Properties of Semiconductors, Volume 1

How to Cite

Tan, T. Y. and Gösele, U. (2000) Point Defects, Diffusion, and Precipitation, in Handbook of Semiconductor Technology: Electronic Structure and Properties of Semiconductors, Volume 1 (eds K. A. Jackson and W. Schröter), Wiley-VCH Verlag GmbH, Weinheim, Germany. doi: 10.1002/9783527621842.ch5

Editor Information

  1. 3

    The University of Arizona, Arizona Materials Laboratory, 4715 E. Fort Lowell Road, Tucson, AZ 85712, USA

  2. 4

    IV. Physikalisches Institut der Georg-August-Universität Göttingen, Bunsenstraße 13–15, D-37073 Göttingen, Germany

Author Information

  1. 1

    Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC 27708-0300, USA

  2. 2

    Max-Planck-Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany

Publication History

  1. Published Online: 28 MAY 2008
  2. Published Print: 27 JUN 2000

ISBN Information

Print ISBN: 9783527298341

Online ISBN: 9783527621842

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