Chapter 17. Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis
- ao. Univ. Prof. Dr. Michael J. Zehetbauer3 and
- Yuntian Theodore Zhu Ph.D. Associate Professor4
Published Online: 24 JUN 2009
Copyright © 2009 Wiley-VCH Verlag GmbH & Co. KGaA
Bulk Nanostructured Materials
How to Cite
Ungár, T., Schafler, E. and Gubicza, J. (2009) Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis, in Bulk Nanostructured Materials (eds M. J. Zehetbauer and Y. T. Zhu), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527626892.ch17
University of Vienna, Chair of Research Group ‘Physics of Nanostructured Materials’, Faculty of Physics, Boltzmanngasse 5, 1090 Wien, Austria
Department of Materials Science & Engineering, North Carolina State University, Rm 308, Research Building II, 1009 Capability Dr., Raleigh, NC 27695-7919, USA
- Published Online: 24 JUN 2009
- Published Print: 28 JAN 2009
Print ISBN: 9783527315246
Online ISBN: 9783527626892
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