Chapter 17. Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis

  1. ao. Univ. Prof. Dr. Michael J. Zehetbauer3 and
  2. Yuntian Theodore Zhu Ph.D. Associate Professor4
  1. Tamás Ungár1,
  2. Erhard Schafler2 and
  3. Jenö Gubicza1

Published Online: 24 JUN 2009

DOI: 10.1002/9783527626892.ch17

Bulk Nanostructured Materials

Bulk Nanostructured Materials

How to Cite

Ungár, T., Schafler, E. and Gubicza, J. (2009) Microstructure of Bulk Nanomaterials Determined by X-Ray Line-Profile Analysis, in Bulk Nanostructured Materials (eds M. J. Zehetbauer and Y. T. Zhu), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527626892.ch17

Editor Information

  1. 3

    University of Vienna, Chair of Research Group ‘Physics of Nanostructured Materials’, Faculty of Physics, Boltzmanngasse 5, 1090 Wien, Austria

  2. 4

    Department of Materials Science & Engineering, North Carolina State University, Rm 308, Research Building II, 1009 Capability Dr., Raleigh, NC 27695-7919, USA

Author Information

  1. 1

    Eötvös University, Department of Materials Physics, Budapest, Hungary

  2. 2

    Institute of Materials Physics, University Vienna, Austria

Publication History

  1. Published Online: 24 JUN 2009
  2. Published Print: 28 JAN 2009

ISBN Information

Print ISBN: 9783527315246

Online ISBN: 9783527626892

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