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Appendix B: Atomic Force Microscopy

  1. Dr. Renate Förch1,
  2. Prof. Dr. Holger Schönherr2 and
  3. Dr. A. Tobias A. Jenkins3

Published Online: 9 SEP 2009

DOI: 10.1002/9783527628599.app2

Surface Design: Applications in Bioscience and Nanotechnology

Surface Design: Applications in Bioscience and Nanotechnology

How to Cite

Förch, R., Schönherr, H. and Jenkins, A. T. A. (eds) (2009) Appendix B: Atomic Force Microscopy, in Surface Design: Applications in Bioscience and Nanotechnology, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527628599.app2

Editor Information

  1. 1

    Max-Planck-Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany

  2. 2

    University of Siegen, Department of Physical Chemistry, Adolf-Reichwein-Straße 2, 57076 Siegen, Germany

  3. 3

    University of Bath, Department of Chemistry, Bath BA2 7AY, United Kingdom

Publication History

  1. Published Online: 9 SEP 2009
  2. Published Print: 12 JUN 2009

ISBN Information

Print ISBN: 9783527407897

Online ISBN: 9783527628599

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Summary

This appendix contains sections titled:

  • Principles of AFM

  • Intermittent Contact Mode AFM

  • References