Chapter 2.1. Controlled Block-Copolymer Thin-Film Architectures

  1. Dr. Renate Förch3,
  2. Prof. Dr. Holger Schönherr4 and
  3. Dr. A. Tobias A. Jenkins5
  1. Monique Roerdink1,
  2. Mark A. Hempenius1,
  3. Ulrich Gunst2,
  4. Heinrich F. Arlinghaus2 and
  5. G. Julius Vancso1

Published Online: 9 SEP 2009

DOI: 10.1002/9783527628599.ch5

Surface Design: Applications in Bioscience and Nanotechnology

Surface Design: Applications in Bioscience and Nanotechnology

How to Cite

Roerdink, M., Hempenius, M. A., Gunst, U., Arlinghaus, H. F. and Vancso, G. J. (2009) Controlled Block-Copolymer Thin-Film Architectures, in Surface Design: Applications in Bioscience and Nanotechnology (eds R. Förch, H. Schönherr and A. T. A. Jenkins), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527628599.ch5

Editor Information

  1. 3

    Max-Planck-Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany

  2. 4

    University of Siegen, Department of Physical Chemistry, Adolf-Reichwein-Straße 2, 57076 Siegen, Germany

  3. 5

    University of Bath, Department of Chemistry, Bath BA2 7AY, United Kingdom

Author Information

  1. 1

    University of Twente, MESA+ Institute for Nanotechnology, Department of Materials Science and Technology of Polymers, P.O. Box 217, 7500 AE Enschede, The Netherlands

  2. 2

    Westfälische Wilhelms-Universität Münster, Physikalisches Institut, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany

Publication History

  1. Published Online: 9 SEP 2009
  2. Published Print: 12 JUN 2009

ISBN Information

Print ISBN: 9783527407897

Online ISBN: 9783527628599



  • functional thin film architecture;
  • controlled block-copolymer;
  • wetting;
  • planar substrates;
  • topographically patterned substrates


The substrate wetting of an amorphous, low glass transition temperature spherical poly(isoprene-block-ferrocenylsilane) (PI-b-PFS) block-copolymer and the alignment of the microdomains in grooves of various geometry were studied. Compositional analysis by time-of-flight secondary ion mass spectrometry depth profiling (TOF-SIMS) indicates the presence of both PI and PFS directly at the film/substrate interface on silicon and silica substrates. The TOF-SIMS depth-profiling study indicates a transition in the packing of the domains between the two-dimensional (2D) monolayer and 3D, thicker layers. In a monolayer of domains, a hexagonal packing is adopted. In films of two or three layers, the hexagonal packing reorganizes towards a body-centered cubic (bcc) packing by the extension of the copolymer chains in the direction normal to the substrate, as indicated by an increase in spacing between PFS layers and an increase in domain size. For thicker layers, a bcc morphology with the (110) plane parallel to the substrate is found to extend from the free surface downwards. Films of one monolayer of domains of the copolymer exhibit long-range lateral ordering on the micrometer scale on flat substrates without high-temperature annealing. On topographically patterned silicon substrates the position of the domains of the minority PFS phase directly near the side walls is fixed by the neutral wetting condition. Successful positioning of the block-copolymer spheres in linear and hexagonal grooves is achieved in grooves up to 1.3 mm wide, whereby the hexagonal grooves demonstrate complete 2D alignment. In circular pits, this graphoepitaxial effect is absent.