3. Advances in Magnetization Dynamics Using Scanning Transmission X-Ray Microscopy

  1. Dr. Jinghua Guo
  1. Tolek Tyliszczak and
  2. Kang Wei Chou

Published Online: 8 NOV 2010

DOI: 10.1002/9783527632282.ch3

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

How to Cite

Tyliszczak, T. and Chou, K. W. (2010) Advances in Magnetization Dynamics Using Scanning Transmission X-Ray Microscopy, in X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques (ed J. Guo), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527632282.ch3

Editor Information

  1. Lawrence Berkeley National Laboratory, Advanced Light Source Division, One Cyclotron Road, MS 6R2100, Berkeley, CA 94720, USA

Author Information

  1. Lawrence Berkeley, National Laboratory, Berkeley Laboratory, 1 Cyclotron Road, Berkeley, CA 94720-8226, USA

Publication History

  1. Published Online: 8 NOV 2010
  2. Published Print: 27 OCT 2010

ISBN Information

Print ISBN: 9783527322886

Online ISBN: 9783527632282

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.

Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >