4. Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials

  1. Dr. Jinghua Guo
  1. Jau-Wern Chiou1 and
  2. Chia-Hao Chen2

Published Online: 8 NOV 2010

DOI: 10.1002/9783527632282.ch4

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

How to Cite

Chiou, J.-W. and Chen, C.-H. (2010) Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials, in X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques (ed J. Guo), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527632282.ch4

Editor Information

  1. Lawrence Berkeley National Laboratory, Advanced Light Source Division, One Cyclotron Road, MS 6R2100, Berkeley, CA 94720, USA

Author Information

  1. 1

    National University of Kaohsiung, Department of Applied Physics, 700 Kaohsiung University Road, Kaohsiung 81148, Taiwan

  2. 2

    National Synchrotron, Radiation Research Center, 101 Hsin-Ann Road, Hsinchu 30076, Taiwan

Publication History

  1. Published Online: 8 NOV 2010
  2. Published Print: 27 OCT 2010

ISBN Information

Print ISBN: 9783527322886

Online ISBN: 9783527632282

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