7. Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials

  1. Dr. Jinghua Guo
  1. Dr. Jinghua Guo

Published Online: 8 NOV 2010

DOI: 10.1002/9783527632282.ch7

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques

How to Cite

Guo, J. (2010) Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials, in X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques (ed J. Guo), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527632282.ch7

Editor Information

  1. Lawrence Berkeley National Laboratory, Advanced Light Source Division, One Cyclotron Road, MS 6R2100, Berkeley, CA 94720, USA

Author Information

  1. Lawrence Berkeley National Laboratory, Advanced Light Source Division, One Cyclotron Road, MS 6R2100, Berkeley, CA 94720, USA

Publication History

  1. Published Online: 8 NOV 2010
  2. Published Print: 27 OCT 2010

ISBN Information

Print ISBN: 9783527322886

Online ISBN: 9783527632282

SEARCH

Keywords:

  • X-ray absorption spectroscopy;
  • resonant inelastic X-ray scattering;
  • XAS;
  • XES;
  • RIXS;
  • TiO2;
  • electronic structure;
  • in-situ soft x-ray spectroscopy;
  • hydrogen storage;
  • buried interface layer

Summary

This chapter contains sections titled:

  • Introduction

  • Electronic Structure of Nanostructured Materials

  • Soft X-Ray Process and Spectroscopy

  • Chemical Sensitivity of X-Ray Spectroscopy

  • Fullerenes and Carbon Nanotubes

  • Buried Atomical Layers and Interfaces

  • Nanostructured 3d Transition Metal Oxides

  • Acknowledgments

  • References