2. Depth-Resolved Displacement Field Measurement

  1. Prof. Guillermo H. Kaufmann2,3
  1. Jonathan M. Huntley and
  2. Pablo D. Ruiz

Published Online: 21 FEB 2011

DOI: 10.1002/9783527633852.ch2

Advances in Speckle Metrology and Related Techniques

Advances in Speckle Metrology and Related Techniques

How to Cite

Huntley, J. M. and Ruiz, P. D. (2011) Depth-Resolved Displacement Field Measurement, in Advances in Speckle Metrology and Related Techniques (ed G. H. Kaufmann), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527633852.ch2

Editor Information

  1. 2

    Instituto de Fisica Rosario, Universidad Nacional de Rosario, Facultad de Ciencias Exactas e Ingeniería, Department of Physics and Centro Internacional Franco Argentino de Ciencias, de la Información y de Sistemas, Rosario, Argentina

  2. 3

    Instituto de Fisica Rosario, Blvd. 27 de Febrero 210 bis, S2000EZP Rosario, Argentina

Author Information

  1. Loughborough University, Wolfson School of Mechanical and Manufacturing Engineering, Ashby Road, Loughborough LE11 3TU, United Kingdom

Publication History

  1. Published Online: 21 FEB 2011
  2. Published Print: 23 FEB 2011

ISBN Information

Print ISBN: 9783527409570

Online ISBN: 9783527633852

SEARCH

Keywords:

  • depth-resolved displacement field measurement;
  • low-coherence electronic speckle pattern interferometry;
  • phase unwrapping;
  • spectral optical coherence tomography (SOCT);
  • tilt scanning interferometry (TSI);
  • wavelength scanning interferometry (WSI)

Summary

This chapter presents an overview of the current state of the art of volumetric displacement field imaging using optical interferometric techniques. It describes the interferometric depth-resolving displacement-sensing technique to be developed was known as low-coherence speckle pattern interferometry. The chapter introduces the two main techniques, namely, wavelength scanning interferometry (WSI) and tilt scanning interferometry (TSI), which refer, respectively, to the cases of time-varying wavenumber and time-varying illumination direction. It also presents a theoretical framework based on the Ewald sphere that, by means of a simple geometrical construction, allows one to visualize the spatial resolution and displacement component measured by any of the techniques. The chapter reviews recent developments on phase unwrapping in three dimensions. It describes three optical arrangements: first a 2D phase contrast-spectral optical coherence tomography (PC-SOCT) system for single-shot measurement of out-of-plane displacement fields, followed by an adaptation to allow measurement of both in-plane and out-of-plane displacement fields.

Controlled Vocabulary Terms

displacement measurement; electromagnetic wave interferometry; electronic speckle pattern interferometry