16. Elemental Distribution Profiling of Thin Films for Solar Cells

  1. Dr. Daniel Abou-Ras6,
  2. Dr. Thomas Kirchartz7 and
  3. Prof. Dr. Uwe Rau8
  1. Volker Hoffmann1,
  2. Denis Klemm1,
  3. Varvara Efimova1,
  4. Cornel Venzago2,
  5. Angus A. Rockett3,
  6. Thomas Wirth4,
  7. Tim Nunney5,
  8. Christian A. Kaufmann6 and
  9. Raquel Caballero6

Published Online: 7 APR 2011

DOI: 10.1002/9783527636280.ch16

Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells

How to Cite

Hoffmann, V., Klemm, D., Efimova, V., Venzago, C., Rockett, A. A., Wirth, T., Nunney, T., Kaufmann, C. A. and Caballero, R. (2011) Elemental Distribution Profiling of Thin Films for Solar Cells, in Advanced Characterization Techniques for Thin Film Solar Cells (eds D. Abou-Ras, T. Kirchartz and U. Rau), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527636280.ch16

Editor Information

  1. 6

    Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109 Berlin, Germany

  2. 7

    Imperial College London, Blackett Laboratory of Physics, Experimental Solid State Physics, Prince Consort Road, London SW7 2AZ, UK

  3. 8

    Forschungszentrum Jülich, Institut für Energieforschung (IEF-5), Photovoltaik, Leo-Brandt-Straße, 52428 Jülich, Germany

Author Information

  1. 1

    Leibniz Institute for Solid State and Materials Research (IFW) Dresden, Institute for Complex Materials, Helmholtzstraße 20, 01069 Dresden, Germany

  2. 2

    AQura GmbH, Rodenbacher Chaussee 4, 63457 Hanau, Germany

  3. 3

    University of Illinois, Department of Materials Science and Engineering, 1304 W. Green Street, Urbana, IL 61801, USA

  4. 4

    Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, 12205 Berlin, Germany

  5. 5

    Thermo Fisher Scientific, The Birches Industrial Estate, Imberhorne Lane, East Grinstead, West Sussex RH19 1UB, UK

  6. 6

    Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Hahn-Meitner-Platz 1, 14109 Berlin, Germany

Publication History

  1. Published Online: 7 APR 2011
  2. Published Print: 18 MAR 2011

ISBN Information

Print ISBN: 9783527410033

Online ISBN: 9783527636280

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Keywords:

  • glow discharge-optical emission (GD-OES);
  • glow discharge-mass spectroscopy (GD-MS);
  • secondary ion mass spectroscopy (SIMS);
  • Auger electron spectroscopy (AES);
  • X-ray photoelectron spectroscopy (XPS);
  • energydispersive X-ray spectrometry (EDX)

Summary

This chapter contains sections titled:

  • Introduction

  • Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS)

  • Secondary Ion Mass Spectrometry (SIMS)

  • Auger Electron Spectroscopy (AES)

  • X-Ray Photoelectron Spectroscopy (XPS)

  • Energy-Dispersive X-Ray Analysis on Fractured Cross Sections

  • References