15. Photoelectron Spectroscopy in Materials Science and Physical Chemistry: Analysis of Composition, Chemical Bonding, and Electronic Structure of Surfaces and Interfaces

  1. Prof. Rolf Schäfer and
  2. Prof. Peter C. Schmidt
  1. Andreas Klein,
  2. Thomas Mayer,
  3. Andreas Thissen and
  4. Wolfram Jaegermann

Published Online: 25 APR 2012

DOI: 10.1002/9783527636839.ch15

Methods in Physical Chemistry

Methods in Physical Chemistry

How to Cite

Klein, A., Mayer, T., Thissen, A. and Jaegermann, W. (2012) Photoelectron Spectroscopy in Materials Science and Physical Chemistry: Analysis of Composition, Chemical Bonding, and Electronic Structure of Surfaces and Interfaces, in Methods in Physical Chemistry (eds R. Schäfer and P. C. Schmidt), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527636839.ch15

Editor Information

  1. Technische Universität Darmstadt, Eduard-Zintl-Institute of Inorganic and Physical Chemistry, Petersenstraße 20, 64287 Darmstadt, Germany

Author Information

  1. Technische Universität Darmstadt, Fachbereich Material-und Geowissenschaften, Petersenstrasse 23, 64287 Darmstadt, Germany

Publication History

  1. Published Online: 25 APR 2012
  2. Published Print: 25 APR 2012

ISBN Information

Print ISBN: 9783527327454

Online ISBN: 9783527636839

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Keywords:

  • X-ray photoelectron spectroscopy (XPS);
  • electron spectroscopy for chemical analysis (ESCA);
  • synchrotron induced X-ray photoelectron spectroscopy (SXPS);
  • ultraviolet photoelectron spectroscopy (UPS);
  • surface;
  • interface

Summary

This chapter contains sections titled:

  • Introduction

  • Experimental Procedure

  • Case Studies: XPS

  • Case Studies: UPS

  • Conclusions and Perspectives

  • Supplementary Material

  • References