3. Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration

  1. Prof. Gustaaf Van Tendeloo3,
  2. Prof. Dirk Van Dyck3,
  3. Prof. Dr. Stephen J. Pennycook4,5,6
  1. Knut W. Urban1,
  2. Juri Barthel1,
  3. Lothar Houben1,
  4. Chun-Lin Jia1,2,
  5. Markus Lentzen1,
  6. Andreas Thust1,
  7. Karsten Tillmann1

Published Online: 23 MAY 2012

DOI: 10.1002/9783527641864.ch3

Book Title

Handbook of Nanoscopy, Volume 1&2

Handbook of Nanoscopy, Volume 1&2

Additional Information

How to Cite

Urban, K. W., Barthel, J., Houben, L., Jia, C.-L., Lentzen, M., Thust, A. and Tillmann, K. (2012) Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration, in Handbook of Nanoscopy, Volume 1&2 (eds G. Van Tendeloo, D. Van Dyck and S. J. Pennycook), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527641864.ch3

Editor Information

  1. 3

    University of Antwerp (RUCA), EMAT, Groenenborgerlaan 171, 2020 Antwerp, Belgium

  2. 4

    Oak Ridge National Lab., Condensed Matter Science Div., Oak Ridge, TN 37831-6030, USA

  3. 5

    Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37831-6071, USA

  4. 6

    Vanderbilt University, Department of Physics and Astronomy, Nashville, TN 37235, USA

Author Information

  1. 1

    Forschungszentrum Jülich GmbH, Peter Grünberg Institute and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons, D-52425 Jülich, Germany

  2. 2

    Xi'an Jiaotong University, International Centre for Dielectrics Research (ICDR), School of Electronic and Information Engineering, 28 Xianning West Road, Xi'an 710049, China

Publication History

  1. Published Online: 23 MAY 2012
  2. Published Print: 18 APR 2012

ISBN Information

Print ISBN: 9783527317066

Online ISBN: 9783527641864

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