12. Quantitative Optical Microscopy at the Nanoscale: New Developments and Comparisons

  1. Prof. Dr. Wolfgang Osten2 and
  2. Dr. Nadya Reingand3
  1. Bernd Bodermann,
  2. Egbert Buhr,
  3. Zhi Li and
  4. Harald Bosse

Published Online: 23 AUG 2012

DOI: 10.1002/9783527648443.ch12

Optical Imaging and Metrology: Advanced Technologies

Optical Imaging and Metrology: Advanced Technologies

How to Cite

Bodermann, B., Buhr, E., Li, Z. and Bosse, H. (2012) Quantitative Optical Microscopy at the Nanoscale: New Developments and Comparisons, in Optical Imaging and Metrology: Advanced Technologies (eds W. Osten and N. Reingand), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527648443.ch12

Editor Information

  1. 2

    Universität Stuttgart, Institut für Technische Optik, Pfaffenwaldring 9, 70569 Stuttgart, Germany

  2. 3

    CeLight Inc., 12200 Tech Rd., Ste. 200, Silver Spring, MD 20904, USA

Author Information

  1. Physikalisch-Technische, Bundesanstalt, Division Optics, Bundesallee 100, D-38116, Braunschweig, Germany

Publication History

  1. Published Online: 23 AUG 2012
  2. Published Print: 22 AUG 2012

ISBN Information

Print ISBN: 9783527410644

Online ISBN: 9783527648443

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