16. Interferometry in Harsh Environments

  1. Prof. Dr. Wolfgang Osten2 and
  2. Dr. Nadya Reingand3
  1. Jr. Armando Albertazzi G.

Published Online: 23 AUG 2012

DOI: 10.1002/9783527648443.ch16

Optical Imaging and Metrology: Advanced Technologies

Optical Imaging and Metrology: Advanced Technologies

How to Cite

Albertazzi G., A. (2012) Interferometry in Harsh Environments, in Optical Imaging and Metrology: Advanced Technologies (eds W. Osten and N. Reingand), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527648443.ch16

Editor Information

  1. 2

    Universität Stuttgart, Institut für Technische Optik, Pfaffenwaldring 9, 70569 Stuttgart, Germany

  2. 3

    CeLight Inc., 12200 Tech Rd., Ste. 200, Silver Spring, MD 20904, USA

Author Information

  1. Universidade Federal de Santa Catarina, Mechanical Engineering, Department LabMetro, CEP 88 040-970, Florianopolis, SC, Brazil

Publication History

  1. Published Online: 23 AUG 2012
  2. Published Print: 22 AUG 2012

ISBN Information

Print ISBN: 9783527410644

Online ISBN: 9783527648443

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Keywords:

  • interferometry;
  • harsh agents;
  • robust interferometers;
  • out-of-lab interferometry;
  • one-shot interferometry

Summary

This chapter contains sections titled:

  • Introduction

  • Harsh Environments

  • Harsh Agents

  • Requirements for Portable Interferometers

  • Current Solutions

  • Case Studies

  • Closing Remarks

  • References