8. AFM Characterization of Polymer Nanocomposites

  1. Dr. Vikas Mittal
  1. Ken Nakajima,
  2. Dong Wang and
  3. Toshio Nishi

Published Online: 24 AUG 2012

DOI: 10.1002/9783527654505.ch8

Characterization Techniques for Polymer Nanocomposites

Characterization Techniques for Polymer Nanocomposites

How to Cite

Nakajima, K., Wang, D. and Nishi, T. (2012) AFM Characterization of Polymer Nanocomposites, in Characterization Techniques for Polymer Nanocomposites (ed V. Mittal), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527654505.ch8

Editor Information

  1. The Petroleum Institute, Chemical Engineering Department, Room 2204, Bu Hasa Building, Abu Dhabi, United Arab Emirates

Author Information

  1. WPI-Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan

Publication History

  1. Published Online: 24 AUG 2012
  2. Published Print: 4 JUL 2012

ISBN Information

Print ISBN: 9783527331482

Online ISBN: 9783527654505

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Keywords:

  • atomic force microscope (AFM);
  • cantilever deflection;
  • van der Waals force;
  • Hooke's law;
  • Young's modulus;
  • nanoindenter system

Summary

This chapter contains sections titled:

  • Atomic Force Microscope (AFM)

  • Elasticity Measured by AFM

  • Example Studies

  • Conclusion

  • References