7. Photoemission Spectroscopy

  1. Leonard J. Brillson Prof.

Published Online: 28 DEC 2012

DOI: 10.1002/9783527665709.ch7

Surfaces and Interfaces of Electronic Materials

Surfaces and Interfaces of Electronic Materials

How to Cite

Brillson, L. J. (2010) Photoemission Spectroscopy, in Surfaces and Interfaces of Electronic Materials, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany. doi: 10.1002/9783527665709.ch7

Author Information

Publication History

  1. Published Online: 28 DEC 2012
  2. Published Print: 10 MAR 2010

ISBN Information

Print ISBN: 9783527409150

Online ISBN: 9783527665709

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Keywords:

  • black body radiation;
  • photons;
  • photoelectric effect;
  • work function;
  • photoexcitation;
  • binding energy;
  • binding energy;
  • photoionization; Fermi's Golden Rule;
  • resolution, energy;
  • density of states;
  • ionization energy;
  • electron affinity;
  • orbital, shell, Periodic Table;
  • cross section, photoionization;
  • hydrogenic X-ray photoelectron spectroscopy (XPS);
  • chemical shift;
  • escape depth;
  • band bending;
  • neutralization;
  • Schottky barrier;
  • rigid shift;
  • UV photoemission spectroscopy (UPS);
  • monochromator, X-ray;
  • brightness;
  • analyzer, electron energy;
  • analyzer, cylindrical mirror;
  • analyzer, hemispherical

Summary

This chapter contains sections titled:

  • The Photoelectric Effect

  • The Optical Excitation Process

  • Photoionization Cross Section

  • Density of States

  • Experimental Spectrum

  • Experimental Energy Distribution Curves

  • Measured Photoionization Cross Sections

  • Principles of X-Ray Photoelectron Spectroscopy

  • Excitation Sources

  • Electron Energy Analyzers

  • Summary