CM gratefully acknowledges financial support by the Austrian Fonds zur Förderung der wissenschaftlichen Forschung, Project P17375-N07. DK acknowledges support within the framework of the K-plus competence centre program. The authors thank M. Pečar for support with the AES analysis and Prof. Dr. R. Pippan for valuable discussions.
Determination of Mechanical Properties of Copper at the Micron Scale†
Article first published online: 16 NOV 2006
Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Engineering Materials
Special Issue: Materials Science & Engineering
Volume 8, Issue 11, pages 1119–1125, November, 2006
How to Cite
Kiener, D., Motz, C., Schöberl, T., Jenko, M. and Dehm, G. (2006), Determination of Mechanical Properties of Copper at the Micron Scale. Adv. Eng. Mater., 8: 1119–1125. doi: 10.1002/adem.200600129
- Issue published online: 16 NOV 2006
- Article first published online: 16 NOV 2006
- Austrian Fonds zur Förderung der wissenschaftlichen Forschung. Grant Number: P17375-N07
- Auger electron spectroscopy;
- Mechanical properties
Using a focused ion beam workstation, micron-sized bending and compression samples were fabricated from a pure copper single crystal. The bending and compression experiments exhibited a strong size effect on the flow stress of copper, reaching values in the order of 1 GPa for the smallest test structures. Conventional strain gradient plasticity approaches are not capable of explaining this behaviour. The surface damage introduced by Ga+ ion implantation during focused ion beam preparation was investigated using Auger electron spectroscopy and its consequence on the mechanical response of the miniaturized test samples is addressed.