Mechanical Characterization of Thin Films by Use of Atomic Force Acoustic Microscopy
Article first published online: 12 NOV 2010
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Engineering Materials
Volume 13, Issue 4, pages 312–318, April, 2011
How to Cite
Kopycinska-Müller, M., Striegler, A., Köhler, B. and Wolter, K.-J. (2011), Mechanical Characterization of Thin Films by Use of Atomic Force Acoustic Microscopy. Adv. Eng. Mater., 13: 312–318. doi: 10.1002/adem.201000245
- Issue published online: 25 MAR 2011
- Article first published online: 12 NOV 2010
- Manuscript Revised: 21 SEP 2010
- Manuscript Received: 19 AUG 2010
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