The author acknowledges funding from the EPSRC and beamtime made available at the ESRF. He is especially grateful for the support of beamline staff at the ID15 beamline at the ESRF, particularly Dr. Marco di Michiel and Dr. Thomas Buslaps. He is also grateful for discussions with Prof. P.D. Lee and those attending the Workshop on Characterization of Crack Tip Stress Fields held in Forni di Sopra, March 2011. Supporting Information is available online from Wiley Online Library or from the author.
3D Crack-tip Microscopy: Illuminating Micro-Scale Effects on Crack-Tip Behavior†
Version of Record online: 29 SEP 2011
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Engineering Materials
Volume 13, Issue 12, pages 1096–1100, December 2011
How to Cite
Withers, P. J. (2011), 3D Crack-tip Microscopy: Illuminating Micro-Scale Effects on Crack-Tip Behavior. Adv. Eng. Mater., 13: 1096–1100. doi: 10.1002/adem.201100092
- Issue online: 7 DEC 2011
- Version of Record online: 29 SEP 2011
- Manuscript Revised: 5 JUL 2011
- Manuscript Received: 16 MAR 2011
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