Application of Synchrotron Radiation Techniques for Model Validation of Advanced Structural Materials (pages 459–463)
Annick Froideval, Maria Samaras, Roberto Iglesias, Manuel A. Pouchon, Jiachao Chen, Daniel Grolimund, Joerg Raabe, Stefan Schuppler, Maximo Victoria and Wolfgang Hoffelner
Article first published online: 8 JUN 2009 | DOI: 10.1002/adem.200800328
Complementary synchrotron-based X-ray absorption techniques such as extended X-ray absorption fine structure (EXAFS), X-ray magnetic circular dichroism (XMCD), and photoemission electron microscopy (PEEM) are used to address the individual local atomic structure and magnetic moments in Fe–Cr model systems. The formation of atomic clusters/precipitates in such systems is also investigated by means of scanning transmission X-ray microscopy (STXM). Such advanced analytical techniques can not only provide valuable structural and magnetic information on such materials, they can also serve for validating computational calculations performed at different time and length scales.