This work was supported by the Nederlandse Wetenschappelijk Organisatie (NWO/VICI grant to USS). Dr. D. Wouters is thanked for helpful discussions.
Force Spectroscopic Investigations During the Local Oxidation of n-Octadecyltrichlorosilane Monolayers†
Article first published online: 30 NOV 2005
Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Functional Materials
Volume 16, Issue 1, pages 76–82, January, 2006
How to Cite
Hoeppener, S., van Schaik, J. H. K. and Schubert, U. S. (2006), Force Spectroscopic Investigations During the Local Oxidation of n-Octadecyltrichlorosilane Monolayers. Adv. Funct. Mater., 16: 76–82. doi: 10.1002/adfm.200500435
- Issue published online: 27 DEC 2005
- Article first published online: 30 NOV 2005
- Manuscript Accepted: 25 AUG 2005
- Manuscript Received: 8 JUL 2005
- Scanning force spectroscopy;
- Surface modification;
- Surface patterning
Scanning force spectroscopy (SFS) is a powerful tool for investigating surface properties with high precision. Unlike most common spectroscopic techniques, information about local properties can also be obtained from surface areas with nanometer dimensions. This makes SFS a useful investigative tool for small lithographic structures. We apply the continuous recording of force curves to extract valuable information about the local oxidation of a monolayer of n-octadecyltrichlorosilane molecules self-assembled on silicon. The oxidation is carried out while simultaneously recording the force curves during the application of a bias voltage to the tip. The dynamics of the induced surface modifications and changes in the surface properties are followed by analyzing specific spots in the force curves.