The authors wish to thank NOVALED AG for financial support. The authors also thank the Forschungszentrum Rossendorf for the use of the MALDI-TOF set-up and the German BMBF for supporting this work through the project 13N 8855 and 03IP602.
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Analysis of Complete Organic Semiconductor Devices by Laser Desorption/Ionization Time-of-Flight Mass Spectrometry†
Article first published online: 20 AUG 2008
DOI: 10.1002/adfm.200700816
Copyright © 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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How to Cite
Scholz, S., Walzer, K. and Leo, K. (2008), Analysis of Complete Organic Semiconductor Devices by Laser Desorption/Ionization Time-of-Flight Mass Spectrometry. Adv. Funct. Mater., 18: 2541–2547. doi: 10.1002/adfm.200700816
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Publication History
- Issue published online: 5 SEP 2008
- Article first published online: 20 AUG 2008
- Manuscript Revised: 14 APR 2008
- Manuscript Received: 20 JUL 2007
Funded by
- NOVALED AG
- Abstract
- References
- Cited By
Keywords:
- MALDI-TOF-MS;
- organic electronics;
- organic light-emitting diodes;
- organic semiconductors;
- solar cells
Abstract
In this contribution, it is shown that the method of laser-desorption/ionization time-of-flight mass spectrometry (LDI-TOF-MS) is a powerful technique for analyzing complete organic devices, such as organic light-emitting diodes (OLEDs) or organic solar cells. LDI-TOF-MS has the potential to analyze fully processed organic devices without special pretreatment such as dissolving the device, peeling off the metal cathode, or using additional matrix materials. Thus, devices may be analysed as they are with a minimum of measurement artefacts. It is demonstrated that the method allows an analysis of complex organic multilayer devices, their composition, and incorporated impurities. It even allows possible electrochemical reaction products caused by device degradation to be analyzed. Thus, LDI-TOF-MS has major advantages compared to measurements of dissolved samples. As an example, the identification of all of the materials used in a complete OLED is shown. Furthermore, a detailed chemical analysis of long-term driven OLEDs, including the detection of degradation products, is presented. From these data, several degradation mechanisms can be distinguished.