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Lateral Inhomogeneity in the Electronic Structure of a Conjugated Poly(3-hexylthiophene) Thin Film

Authors

  • Kaname Kanai,

    Corresponding author
    1. Research Core for Interdisciplinary Sciences, Okayama University 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
    2. Current address: Department of Physics, Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278-8510 (Japan)
    • Research Core for Interdisciplinary Sciences, Okayama University 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan).
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  • Takahiro Miyazaki,

    1. Department of Chemistry, Graduate School of Science, Nagoya University Furo-cho, Chikusa-ku, Nagoya 464-8602 (Japan)
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  • Takanori Wakita,

    1. Research Laboratory for Surface Science, Okayama University 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
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  • Kouki Akaike,

    1. Department of Chemistry, Graduate School of Science, Nagoya University Furo-cho, Chikusa-ku, Nagoya 464-8602 (Japan)
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  • Takayoshi Yokoya,

    1. Research Laboratory for Surface Science, Okayama University 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
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  • Yukio Ouchi,

    1. Department of Chemistry, Graduate School of Science, Nagoya University Furo-cho, Chikusa-ku, Nagoya 464-8602 (Japan)
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  • Kazuhiko Seki

    1. Department of Chemistry, Graduate School of Science, Nagoya University Furo-cho, Chikusa-ku, Nagoya 464-8602 (Japan)
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Abstract

How annealing influences the morphology of a highly regioregular poly(3-hexylthiophene) (RR-P3HT) film at the substrate interface as well as the lateral inhomogeneity in the electronic structure of the film are elucidated. Whereas previous studies have reported that high-molecular-weight (MW) RR-P3HT films tend to show low crystallinity even after annealing, it is found that high-MW RR-P3HT does show high crystallinity after annealing at high temperature for a long time. Photoemission electron microscopy (PEEM), X-ray photoemission spectroscopy, and ultraviolet photoemission spectroscopy results clearly resolve a considerable lateral inhomogeneity in the morphology of RR-P3HT film, which results in a variation of the electronic structure depending on the local crystallinity. The PEEM results show how annealing facilitates crystal growth in a high-MW RR-P3HT film.

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