Conductivity of SU-8 Thin Films through Atomic Force Microscopy Nano-Patterning
Version of Record online: 27 JAN 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Functional Materials
Volume 22, Issue 7, pages 1482–1488, April 10, 2012
How to Cite
Martin-Olmos, C., Villanueva, L. G., van der Wal, P. D., Llobera, A., de Rooij, N. F., Brugger, J. and Perez-Murano, F. (2012), Conductivity of SU-8 Thin Films through Atomic Force Microscopy Nano-Patterning. Adv. Funct. Mater., 22: 1482–1488. doi: 10.1002/adfm.201102789
- Issue online: 4 APR 2012
- Version of Record online: 27 JAN 2012
- Manuscript Received: 18 NOV 2011
Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors.
Please note: Wiley Blackwell is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.