Following Chemical Charge Trapping in Pentacene Thin Films by Selective Impurity Doping and Wavelength-Resolved Electric Force Microscopy
Article first published online: 8 AUG 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Functional Materials
Volume 22, Issue 24, pages 5096–5106, December 19, 2012
How to Cite
Smieska, L. M., Pozdin, V. A., Luria, J. L., Hennig, R. G., Hines, M. A., Lewis, C. A. and Marohn, J. A. (2012), Following Chemical Charge Trapping in Pentacene Thin Films by Selective Impurity Doping and Wavelength-Resolved Electric Force Microscopy. Adv. Funct. Mater., 22: 5096–5106. doi: 10.1002/adfm.201200595
- Issue published online: 11 DEC 2012
- Article first published online: 8 AUG 2012
- Manuscript Revised: 7 JUL 2012
- Manuscript Received: 1 MAR 2012
Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors.
Please note: Wiley Blackwell is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.