Bias-Stress-Induced Charge Trapping at Polymer Chain Ends of Polymer Gate-Dielectrics in Organic Transistors
Article first published online: 9 JUL 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Advanced Functional Materials
Volume 22, Issue 22, pages 4833–4839, November 21, 2012
How to Cite
Choi, H. H., Lee, W. H. and Cho, K. (2012), Bias-Stress-Induced Charge Trapping at Polymer Chain Ends of Polymer Gate-Dielectrics in Organic Transistors. Adv. Funct. Mater., 22: 4833–4839. doi: 10.1002/adfm.201201084
- Issue published online: 9 NOV 2012
- Article first published online: 9 JUL 2012
- Manuscript Received: 18 APR 2012
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