Full Paper
Top-Down Fabrication of High Quality III–V Nanostructures by Monolayer Controlled Sculpting and Simultaneous Passivation
Article first published online: 26 OCT 2012
DOI: 10.1002/adfm.201202201
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Naureen, S., Shahid, N., Sanatinia, R. and Anand, S. (2013), Top-Down Fabrication of High Quality III–V Nanostructures by Monolayer Controlled Sculpting and Simultaneous Passivation. Adv. Funct. Mater., 23: 1620–1627. doi: 10.1002/adfm.201202201
Publication History
- Issue published online: 2 APR 2013
- Article first published online: 26 OCT 2012
- Manuscript Received: 3 AUG 2012
Keywords:
- semiconductor nanostructures;
- monolayer etching;
- surface passivation;
- nanowires;
- top-down fabrication;
- membranes
Abstract
In the fabrication of III–V semiconductor nanostructures for electronic and optoelectronic devices, techniques that are capable of removing material with monolayer precision are as important as material growth to achieve best device performances. A robust chemical treatment is demonstrated using sulfur (S)-oleylamine (OA) solution, which etches layer by layer in an inverse epitaxial fashion and simultaneously passivates the surface. The application of this process to push the limits of top-down nanofabrication is demonstrated by the realization of InP-based high optical quality nanowire arrays, with aspect ratios more than 50, and nanostructures with new topologies. The findings are relevant for other III–V semiconductors and have potential applications in III–V device technologies.

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