SEARCH

SEARCH BY CITATION

Cited in:

CrossRef

This article has been cited by:

  1. 1
    Po-Chun Yeh, Wencan Jin, Nader Zaki, Datong Zhang, Jonathan T. Liou, Jerzy T. Sadowski, Abdullah Al-Mahboob, Jerry I. Dadap, Irving P. Herman, Peter Sutter, Richard M. Osgood, Layer-dependent electronic structure of an atomically heavy two-dimensional dichalcogenide, Physical Review B, 2015, 91, 4

    CrossRef

  2. 2
    Kun Yao, Guangchun Zhang, Yichao Lin, Jiang Gong, Hui Na, Tao Tang, One-pot approach to prepare high-performance graphene-reinforced poly(vinyl chloride) using lithium alkyl as covalent bonding agent, Polym. Chem., 2015, 6, 3, 389

    CrossRef

  3. 3
    Tomoaki Kaneko, Takahisa Ohno, Effect of surface oxidation on transport properties in graphene–metal junctions, Japanese Journal of Applied Physics, 2014, 53, 5S1, 05FD07

    CrossRef

  4. 4
    Arjun Dahal, Matthias Batzill, Graphene–nickel interfaces: a review, Nanoscale, 2014, 6, 5, 2548

    CrossRef

  5. 5
    Po-Chun Yeh, Wencan Jin, Nader Zaki, Datong Zhang, Jerzy T. Sadowski, Abdullah Al-Mahboob, Arend M. van der Zande, Daniel A. Chenet, Jerry I. Dadap, Irving P. Herman, Peter Sutter, James Hone, Richard M. Osgood, Probing substrate-dependent long-range surface structure of single-layer and multilayer <span class="aps-inline-formula"><math><mi>Mo</mi><msub><mi mathvariant="normal">S</mi><mn>2</mn></msub></math></span> by low-energy electron microscopy and microprobe diffraction, Physical Review B, 2014, 89, 15

    CrossRef

  6. 6
    Wencan Jin, Po-Chun Yeh, Nader Zaki, Datong Zhang, Jerzy T. Sadowski, Abdullah Al-Mahboob, Arend M. van der Zande, Daniel A. Chenet, Jerry I. Dadap, Irving P. Herman, Peter Sutter, James Hone, Richard M. Osgood, Direct Measurement of the Thickness-Dependent Electronic Band Structure of MoS_{2} Using Angle-Resolved Photoemission Spectroscopy, Physical Review Letters, 2013, 111, 10

    CrossRef

  7. 7
    E. Koren, E. Sutter, S. Bliznakov, F. Ivars-Barcelo, P. Sutter, Isolation of high quality graphene from Ru by solution phase intercalation, Applied Physics Letters, 2013, 103, 12, 121602

    CrossRef