Surface Characterization: Non-Invasive High-Throughput Metrology of Functionalized Graphene Sheets (Adv. Funct. Mater. 21/2012)

Authors

  • Maziar Ghazinejad,

    1. Departments of Mechanical, Engineering and Bioengineering, Materials Science and Engineering Program, University of California, Riverside, CA 92521 USA
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  • Jennifer Reiber Kyle,

    1. Departments of Electrical Engineering and Chemistry, University of California, Riverside, CA 92521 USA
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  • Shirui Guo,

    1. Departments of Electrical Engineering and Chemistry, University of California, Riverside, CA 92521 USA
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  • Dennis Pleskot,

    1. Departments of Mechanical, Engineering and Bioengineering, Materials Science and Engineering Program, University of California, Riverside, CA 92521 USA
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  • Duoduo Bao,

    1. Department of Bioengineering, University of California, Riverside, CA 92521 USA
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  • Valentine I. Vullev,

    1. Department of Bioengineering, University of California, Riverside, CA 92521 USA
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  • Mihrimah Ozkan,

    Corresponding author
    1. Departments of Electrical Engineering and Chemistry, University of California, Riverside, CA 92521 USA
    • Departments of Electrical Engineering and Chemistry, University of California, Riverside, CA 92521 USA
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  • Cengiz S. Ozkan

    Corresponding author
    1. Departments of Mechanical, Engineering and Bioengineering, Materials Science and Engineering Program, University of California, Riverside, CA 92521 USA
    • Departments of Mechanical, Engineering and Bioengineering, Materials Science and Engineering Program, University of California, Riverside, CA 92521 USA.
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Abstract

original image

On page 4519, Mihrimah Ozkan, Cengiz S. Ozkan, and co-workers report a new fluorescence quenching microscopy metrology technique that allows the identification of graphene layers and doped/undoped regions across a large graphene landscape by utilizing the fact that undoped regions of graphene quench fluorescence more than the doped regions through resonant energy transfer. Contrast differences in fluorescence across the graphene sheet reveal the complex ring-patterned doping. This metrology technique is well-suited for industrial, large-scale, pristine, and modified graphene sheet surface characterization.

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