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Keywords:

  • organic thin film transistors;
  • vapor jet printing;
  • portable organic deposition;
  • synchrotron characterization;
  • crystallinity;
  • mobility;
  • oxidation
Thumbnail image of graphical abstract

M. Shtein and co-workers use guard flow-enhanced organic vapor jet printing for the additive patterning of pentacene thin fifilms in air, and perform in situ X-ray diffraction to relate process variables, oxidation, structural defects, and electronic properties in thin-film transistor applications. The process structureproperty relationship is quantifified, and the field-effect mobility is extrapolated based on the processing conditions. The schematic shown represents the GF-OVJP process with in situ diffraction and contacts for TFT measurements.