Surface analysis I. Imaging surfaces, electric charges and magnetic domains with the atomic force microscope

Authors

  • Dr. Jürgen P. Rabe

    1. Max-Planck-Institut für Polymerforschung Postfach 3148, D–6500 Mainz (FRG)
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    • studied physics at RWTH Aachen, gaining his Diploma in 1981, and at the Technical University in Munich where he completed his doctoral work in 1984. He then spent two years as a Postdoctoral Fellow at the IBM Almaden Research Center in San Jose, Calijornia before taking up his present position on the Research Staff of the Max Planck Institute for Polymer Research in Mainz, FRG. His research interests include the chemical physics of ultrathin organic films, STM and related microscopies, and vibrational spectroscopy. From now on he will be writing regularly for Advanced Materials on aspects of surjace analysis.


Abstract

Surface Analysis I. Atomic Force Microscopy (AFM) provides a method of imaging surfaces on an atomic scale. Closely related to STM, AFM can, however, image insulating materials such as organic molecules. The technique is described and some recent applications discussed in the first article of a regular series from Jürgen Rube on surface analysis techniques.

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