Thanks are due to H. Lemke for recording the experimental VDW curve. Valuable discussions with C. Heiden are gratefully acknowledged.
van der waals interactions in force microscopy†
Article first published online: 15 SEP 2004
Copyright © 1990 Verlag GmbH & Co. KGaA, Weinheim
Volume 2, Issue 12, pages 594–597, December 1990
How to Cite
Hartmann, U. (1990), van der waals interactions in force microscopy. Adv. Mater., 2: 594–597. doi: 10.1002/adma.19900021208
- Issue published online: 15 SEP 2004
- Article first published online: 15 SEP 2004
- Manuscript Received: 13 JUL 1990
Due to its high sensitivity, scanning force microscopy offers the possibility to map minute van der Waals forces between microprobe and sample surface at high spatial resolution. A detailed theoretical analysis confirms that the interactions involved directly reflect near-surface dielectric properties hardly accessible to conventional detection techniques. This opens a new field of application to modern scanned-probe techniques: van der Waals microscopy.