was born in Kosmeden, FRG, and studied chemistry at the University of Marburg/Lahn, gaining his Ph.D. in 1965 for work on “Energy Transfer in Monolayer Systems.” Since 1971 he has been at the Max-Planck-Institut, für Biophysikalische Chemie in Göttingen while also lecturing at the University of Marburg. His areas of interest include the physical chemistry of interfaces, the organization of complex monolayers and the photochemistry of organized systems.
Structural Characterization of Monolayers at the air–water interface
Article first published online: 15 SEP 2004
Copyright © 1991 Verlag GmbH & Co. KGaA, Weinheim
Volume 3, Issue 1, pages 19–24, January 1991
How to Cite
Möbius, D. and Möhwald, H. (1991), Structural Characterization of Monolayers at the air–water interface. Adv. Mater., 3: 19–24. doi: 10.1002/adma.19910030104
- Issue published online: 15 SEP 2004
- Article first published online: 15 SEP 2004
- Manuscript Received: 1 JUN 1990
- X-Ray Diffraction;
- Fluorescence Microscopy;
- Reflection Spectroscopy;
- Domain Structures
Review: X-Ray diffraction, fluorescence microscopy, and reflection spectroscopy, are all methods used for the characterization of organic thin films which enable the study of, for example, dipole layers, domain structures, mechanical surface excitations, and the orientation of the hydrocarbon ‘tails’. The methods and their applications, especially in the optimization of monolayer formation and transfer, are reviewed.