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Advanced Materials

Characterization and modification of conducting substrates for ultrathin organic films by scanning tunneling microscopy

Authors


  • This work was supported by the BMFT, Grant No. 03 M. 4008, and by the ESF Additional Activity: Chemistry and Physics of Polymer Surfaces and Interfaces.

Abstract

Communication: The structure of an organic film of molecular thickness depends strongly on the surface properties of the underlying substrate. STM is a method which enables a substrate surface to be characterized and controlled as demonstrated in the figure, where the letter “U” etched with an STM tip into a highly oriented pyrolytic graphite (HOPG) surface is shown. The holes, which are around 5 nm in diameter, could serve as nucleation sites for an organic adsorbate phase.

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