Born in Hamburg, FRG, and studied Physics at the University of Munich. In 1965 he moved to Sweden to become Professor of Solid State Physics and Head of Department at the University of Lund. He is a member of both the Royal Swedish and New York Academies of Science and a Fellow of the American Physical Society. He his published two books and more than 150 other scientific articles and is the Editor or Co-Editor of several international journals, including Europhysics Letters.
Defect Spectroscopy in semiconductors†
Article first published online: 15 SEP 2004
Copyright © 1992 Verlag GmbH & Co. KGaA, Weinheim
Volume 4, Issue 4, pages 261–272, April 1992
How to Cite
Grimmeiss, H. G. and Kleverman, M. (1992), Defect Spectroscopy in semiconductors. Adv. Mater., 4: 261–272. doi: 10.1002/adma.19920040403
The authors would like to thank J.-O. Fornell, E. L. Hellqvist, V. Nagesh, and J. Olajos for their contributions. They are also grateful to the Swedish Board for Technical Development and the Swedish Natural Science Research Council for their financial support. Cooperation with the groups of E. Kasper and E. H. Poindexter is acknowledged. [AM-8111]
- Issue published online: 15 SEP 2004
- Article first published online: 15 SEP 2004
- Manuscript Revised: 25 OCT 1991
- Manuscript Received: 5 JUL 1991
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