Scanning tunneling microscopy of nanoscale electrodeposited superlattices

Authors


  • The authors wish to thank R. P. Raffaelle, R. J. Phillips, and C. J. Hung of the University of Missouri–Rolla for their contributions to this work. This research was supported in part by National Science Foundation grant DMR-9202872 and by Office of Naval Research grant N00014-91-J-1499.

Abstract

Artificially layered superconductor materials based on crystalline multilayer structure are of potential interest due to the unusual quantum effects which could be expected in materials of this type. Scanning tunneling microscopy has recently been used (e.g. see Figure) to measure the modulation wavelength (the bilayer thickness) and to estimate the composition profile in such superlattices.

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