Advanced Materials

Structural studies on Superconducting materials and fullerites by electron microscopy

Authors

  • Prof. Gustaaf van Tendeloo,

    Corresponding author
    1. EMAT, University of Antwerp (RUCA), Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
    • EMAT, University of Antwerp (RUCA), Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
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    • was born in Lier (Belgium) in 1950 and studied at the University of Antwerp, obtaining a Ph.D. in 1974 for work on order–disorder transformations in fcc-based alloys. From 1985 to 1988 he was a Professor of Solid State Physics at the University of Brussels, and since 1988 he has been a Professor of Physics at the University of Antwerp. His research interests concentrate on the application of electron microscopy in materials science, especially phase transitions, modulated structures, high-Tc superconductors and fullerene-based materials.

  • Prof. Severin Amelinckx

    Corresponding author
    1. EMAT, University of Antwerp (RUCA), Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
    • EMAT, University of Antwerp (RUCA), Groenenborgerlaan 171, B-2020 Antwerp (Belgium)
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    • was born in Willebroek (Belgium) in 1922. He received a doctorate in physics from the University of Ghent. He was a Professor of Physics at the University of Antwerp until he retired from teaching in 1987. His present activities are concerned with structural and microstructural research on many different classes of materials, such as fullerites, high-Tc superconductors, long-period alloys, and mixed layer compounds, using electron diffraction and electron microscopy. He is the author or co-author of over 600 scientific papers and of more than 10 books or chapters in books, all in the fields of microstructural studies and diffraction.


  • The authors would like to acknowledge the following scientists for their collaboration: T. Krekels, S. Muto, C. Van Heurck, J. Van Landuyt of the University of Antwerp (RUCA), O. Milat of the University of Zagreb, D. Wagener, M. Buchgeister, S.M. Hosseini, P. Herzog of the University of Bonn, T.N.G. Babu, P.R. Slater and C. Greaves of the University of Birmingham, M.A. Verheijen, P.H.M. van Loosdrecht, G. Meijer of the University of Nijmegen. The work has been performed in the framework of an IUAP-48 contract and with financial help of the National Impulse Programme on High-Tc Superconductivity (SU/03/17).

Abstract

High-resolution electron microscopy (HREM) has proved invaluable in the study of local structure—i.e. defects—which in many cases govern the physical, chemical, and electrical properties of materials. The use of HREM in investigations of cuprate high-temperature superconductors is reviewed, especially for compounds in which substituents replace some of the copper. HREM can also be very successfully combined with other techniques, such as electron diffraction, as is demonstrated by results of research on the structure and phase transitions of C60 and C70.

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